Nikon CF Plan 50X/0.55 BD ELWD Microscope Objective Lens
Nikon CF Plan 50X/0.55 BD ELWD Microscope Objective Lens
Nikon CF Plan 50X/0.55 BD ELWD Microscope Objective Lens
Nikon CF Plan 50X/0.55 BD ELWD Microscope Objective Lens
Nikon CF Plan 50X/0.55 BD ELWD Microscope Objective Lens
Product Description

Nikon CF Plan 50X/0.55 BD ELWD Microscope Objective Lens

The Nikon CF Plan 50X/0.55 BD ELWD is a premium infinity-corrected metallurgical microscope objective lens designed for advanced industrial and material science applications. Utilizing Nikon’s renowned CF (Chromatic Aberration-Free) optical design, this lens delivers exceptional field flatness and high-contrast imaging across the entire view. It features a 50x magnification and a 0.55 numerical aperture, ensuring precise resolution for detailed surface inspections. The Extra Long Working Distance (ELWD) of 8.2mm provides crucial clearance for examining uneven topographies, thick samples, or utilizing specialized manipulation tools. Additionally, its Brightfield/Darkfield (BD) illumination capability allows for versatile imaging techniques, making it an indispensable tool for identifying surface defects, scratches, and structural details on specimens designed to be viewed without a cover glass.

Technical Specifications:

  • Brand: Nikon
  • Model: CF Plan 50X/0.55 BD ELWD
  • Magnification: 50X
  • Numerical Aperture (NA): 0.55
  • Working Distance (WD): 8.2mm
  • Optical Tube Length: Infinity-corrected (∞)
  • Illumination Compatibility: Brightfield / Darkfield (BD)
  • Lens Type: Extra Long Working Distance (ELWD)
  • Cover Glass Thickness: 0 (Designed for use without a cover glass)

Nikon CF Plan 50X/0.55 BD ELWD Microscope Objective Lens Description

Nikon CF Plan 50X/0.55 BD ELWD Microscope Objective Lens

Enhance your metallurgical microscopy with the Nikon CF Plan 50X/0.55 BD ELWD objective lens. Featuring an extra-long 8.2mm working distance, brightfield/darkfield compatibility, and infinity-corrected optics, this high-performance lens delivers crisp, flat, and high-contrast images ideal for industrial inspection, semiconductor analysis, and materials science.